signal protection
1.12 USB 2.0 Hot Swap (EOS) Failure Protection Scheme
Advantages of the solution: The USB interface is prone to EOS failure (hot plugging). EOS refers to the damage of electronic components due to exceeding the rated voltage, current or power (overvoltage, overcurrent, overpower). ESD (electrostatic discharge) is a special form of EOS, but usually refers to transient high voltage (nanosecond level), while EOS may involve longer durations (microseconds to seconds) of overload, higher energy, and wider damage range. Therefore, choosing ESD requires higher power.
This solution uses high-power discrete components to protect against ESD and EOS, ensuring signal integrity, and meeting IEC 61000-4-2, level 4, contact and air discharge ±30kV.
